Sapphire Automatic Inspection Machine
Inspection data files and defect image files can be displayed using judgment or macro MAP.
It is a high-speed automatic inspection machine for sapphire wafer defects and foreign material defects. It uses a double cassette system to load, inspect, and unload at a cycle time of 30 seconds per wafer. For more details, please download and view the catalog.
- Company：アイティ・テック
- Price：Other
